Department of Physics

Rich  Louie

Rich Louie

Professor of Physics

(253) 535-7653 (office)

Profile

Professional
Emphases

Thin film deposition

Nanofabrication

Vacuum techniques

Responsibilities

Chair 2013-2014

Curriculum Vitae
Education
Degrees

Ph.D. in Applied and Engineering Physics; Dissertation title: "Point Contact Spectroscopy With Nanofabricated Junctions Of Spin And Energy-Dependent Transport In Heterogeneous Ferromagnetic Systems." Advisor: Professor R. A. Buhrman., Cornell University

M.S. in Physics, Cornell University

A.B., magna cum laude in Physics, Harvard University

Secondary Education: Bronx High School of Science, Bronx, NY; Hunter College High School, Manhattan, NY

Personal
Biography

My research interests are plasma etching issues, carbon nanotubes and scanning probe microscopy. I have previously  worked at NASA and the University of Washington. I am also the lead faculty consultant (physics) with an educational software company, Kinetic Books/Perfection Learning. 

Some of my previous research includes the following projects:

  • NASA Langley Research Center: carbon nanotube conduction and their use in a magnetic tunnel junction.
  • NF3-etched GaAs using XPS (X-ray Photoelectron Spectroscopy) in collaboration with Professor Fumio Ohuchi in the Department of Materials Science at the University of Washington.
  • Relating the electrical and structural damage in materials - such as silicon and gallium arsenide - to their Raman spectra, which are obtained by laser light scattering measurements. The Raman measurements tell us something about the mean free path for phonons (excitations in the lattice with quantized energies), which in turn tell us about the defect density.
  • Atomic force microscopy in collaboration with the late Professor Sam Fain in the Department of Physics at the University of Washington. Below is a scanning electron micrograph of an atomic force microscope tip to which I attached a carbon nanotube. We successfully imaged a hard silicon grid with it, but it did not out-perform conventional tips in imaging DNA.

atomic-force-microscope-tip